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Kenneth R Wada

from San Jose, CA
Age ~62

Kenneth Wada Phones & Addresses

  • 1476 Walbrook Dr, San Jose, CA 95129
  • Mililani, HI
  • Sierra Madre, CA
  • San Francisco, CA
  • 1476 Walbrook Dr, San Jose, CA 95129 (408) 218-5110

Work

Position: Medical Professional

Education

Degree: Associate degree or higher

Emails

k***a@comcast.net

Publications

Us Patents

High Throughput Screening Method And Apparatus

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US Patent:
6472144, Oct 29, 2002
Filed:
Mar 20, 2001
Appl. No.:
09/813922
Inventors:
Patricia J. Malin - Palo Alto CA
Kenneth R. Wada - San Jose CA
Peter J. Dehlinger - Palo Alto CA
Assignee:
Cellstat Technologies, Inc. - Belmont CA
International Classification:
C12Q 100
US Classification:
435 4, 4352871, 4352884, 422 8201, 422 8202, 204400, 204403
Abstract:
High-throughput screening method and apparatus are described. The method includes placing cells on a substrate defining a plurality of discrete microwells, at a well density of greater than about 100/cm , with the number of cells in each well being less than about 1000, and where the cells in each well have been exposed to a selected agent. The change in conductance in each well is determined by applying a low-voltage, AC signal across a pair of electrodes paced in that well, and synchronously measuring the conductance across the electrodes, to monitor the level of growth or metabolic activity of cells contained in each well. Also disclosed is an apparatus for carrying out the screening method.

High Throughout Screening Method And Apparatus

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US Patent:
7354704, Apr 8, 2008
Filed:
Oct 29, 2002
Appl. No.:
10/284053
Inventors:
Patricia J. Malin - Palo Alto CA,
Kenneth R. Wada - San Jose CA,
Peter J. Dehlinger - Palo Alto CA,
Assignee:
CellStat Technologies, Inc. - Palo Alto CA
International Classification:
C12Q 1/00
C40B 30/06
C40B 30/10
US Classification:
435 4, 506 10, 506 12
Abstract:
High-throughput screening method and apparatus arm described. The method includes placing cells on a substrate defining a plurality of discrete microwells, at a well density of greater than about 100/cm, with the number of cells in each well being less than about 1000, and where the cells in each well have been exposed to a selected agent. The change in conductance in each well is determined by applying a low-voltage, AC signal across a pair of electrodes placed in that well, and synchronously measuring the conductance across the electrodes, to monitor the level of growth or metabolic activity of cells contained in each well. Also disclosed is an apparatus for carrying out the screening method.

High-Throughput Screening Method And Apparatus

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US Patent:
6235520, May 22, 2001
Filed:
May 14, 1999
Appl. No.:
9/202658
Inventors:
Patricia J. Malin - Palo Alto CA
Kenneth R. Wada - San Jose CA
Peter J. Dehlinger - Palo Alto CA
Assignee:
Cellstat Technologies, Inc. - Belmont CA
International Classification:
C12M 134
US Classification:
4352871
Abstract:
High-throughout screening method and apparatus are described. The method includes placing cells on a substrate defining a plurality of discrete microwells, at a well density of greater than about 100/cm. sup. 2, with the number of sells in each well being less that about 1000, and where the cells in each well have been exposed to a selected agent. The change in conductance in each well is determined by applying a low-voltage, AC signal across a pair of electrodes placed in that well, and synchronously measuring the conductance across the electrodes, to monitor the level of growth or metabolic activity of cells contained in each well. Also disclosed is an apparatus for carrying out the screening method.

System For Electronically Monitoring And Recording Cell Cultures

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US Patent:
5643742, Jul 1, 1997
Filed:
Mar 23, 1995
Appl. No.:
8/374542
Inventors:
Patricia J. Malin - Palo Alto CA
Kenneth Richard Wada - Cupertino CA
Oskar Werner Huber - Belmont CA
Assignee:
CellStat Technologies, Inc. - Belmont CA
International Classification:
C12Q 100
C12M 134
C12M 142
US Classification:
435 29
Abstract:
This invention provides an improved system for monitoring and recording cell cultures. A method for measuring a delay period for an alternating current voltage applied across a pair of pins improves the stability of measurements made with the improved system. A method for applying a voltage across a pair of pins which avoids exceeding a pre-established voltage avoids the possibility of damaging and/or destroying cells while monitoring their culture.

Method And Apparatus For Automatic Melt Indexing

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US Patent:
5008081, Apr 16, 1991
Filed:
Oct 11, 1988
Appl. No.:
7/256022
Inventors:
David A. Blau - Cupertino CA
John Meadows - Los Altos Hills CA
Thomas M. Sherlock - Los Altos Hills CA
Fred Stengel - Redwood City CA
Robert M. Studholme - Saratoga CA
Kenneth R. Wada - San Jose CA
Christopher J. Kepner - San Jose CA
Assignee:
KD Group - Mountain View CA
International Classification:
G01N 3500
US Classification:
422 64
Abstract:
Computer-controlled method and apparatus for automatic melt index testing, including a housing with a base carrying a heater block having a bore therein for receiving a metal cartridge. A cartridge carousel is rotatably carried on the base, and carries a plurality of such cartridges, each cartridge having a plug at the bottom end thereof with a orifice through the plug, and each cartridge having a bore therein for receiving a sample of a test substance and for receiving a piston on top of the pellets. A lift arm grasps the cartridges, one at a time, and places each cartridge into the heater block, under the control of a microcomputer, by both lifting and rotating the transfer arm. The transfer arm includes a solenoid-operated grip for grasping the cartridges. The test unit carries a lift mechanism with a weight mounted atop a tamping rod, and an optical sensor for determining the height of the weight relative to the lift machinism. The weight is lowered by the lifting mechanism until it bears down upon the pellets, and then the cartridge is heated until the test substance melts.
Kenneth R Wada from San Jose, CA, age ~62 Get Report